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Graduate Students:
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(a) Ph.D.
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Ping Lu, "High Resolution Electron Microscopy Studies of Surface Structure and Reactions", 1989
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Martha R. McCartney, "Observation of Electron Irradiation Effects at Transition–Metal Oxide Surfaces", 1989
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Patrick E. Diehl, "Characterization of Xray Mirror Multilayers Sputtered in Reactive Atmospheres", 1993
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Minghui Yao, "Study of Supported Particle Catalysts by Electron Microscopy Methods", 1994
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Anjaneya R. Modak, "Effect of Grain Structure and Interface Characteristics on Giant Magnetoresistance in Co/Cu and Fe/Cr Multilayers", 1994
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Durvasulu Chandrasekhar, "Growth and Characterization of Group IV–Based Alloys on Silicon", 1997
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Margaret Floyd, "Microstructural Evolution of Group IV–Based Alloys on Silicon", 2001
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Jing Li, "The Application of Off–Axis Electron Holography to Semiconductor Materials", 2001
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Balachandar Ramadurai, "Characterization of Magnetic Thin Films used in Magnetic Random Access Memory", 2003
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Toshihiro Aoki, "Characterization of HgCdTe/CdZnTe (211) B Heterostructures and HgTe/HgCdTe Superlattices", 2003
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Lin Gu, "Characterization of Novel Epitaxial Materials for Advanced Tunneling Devices", 2005
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Hao Hu, "Study of Nanoscale Ferromagnetic Materials using Off–Axis Electron Holography", 2005
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M. Rafiqul Islam, "Characterization of Magnetically Doped Amorphous Semiconductors and Nanowires", 2005
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Hua Wang, "Characterization of Magnetic Thin Films and Nanostructures", 2005
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Lin Zhou, "Microstructure Characterization of Nitride Thin Films and Heterostructures", 2006
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Nipun Agarwal, "Characterization of Lithographically Patterned Magnetic Nanostructures", 2007
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ChangZhen Wang, "Characterization of HgCdTe/CdZnTe Epitaxial Materials for Infrared Detectors", 2007
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Titus Leo, "Magnetic Multilayers for Spintronics Applications", 2007
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David A. Cullen, "Characterization of GaN-based High Electron Mobility Transistor Devices", 2010
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Kai He, "Quantitative Phase Imaging of Magnetic Nanostructures using Off–Axis Electron Holography", 2010
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Luying Li, "Determination of electrostatic potential and charge distribution of semiconductor nanostructures using off–axis electron holography", 2011
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Wenfeng Zhao, "Characterization of HgCdTe and HgCdSe materials for the Third Generation Infrared Detectors", 2011
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Lu Ouyang, "Structural characterization of II–VI and III–V compound semiconductor heterostructures and superlattices", 2012
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JaeJin Kim, "Characterization of HgCdTe and related materials and substrates for third generation infrared detectors", 2012
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(b) M.S.
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Durvasulu Chandrasekhar, "Characterization of Group III–nitride semiconductor thin films by high–resolution electron microscopy", 1994
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Qian Jiang, "Microstucture of Silicon-Manganese Thin Films", 2004
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XiaoBo Zhang, "TEM Characterization of II–VI/III–V Heterostructures for Multijunction Solar Cell Applications", 2009
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